Keithley 2634 Test Seq free download

File name 2634 Test Seq.pdf

A G R E AT E R M E A S U R E O F C O N F I D E N C E ity. The integration of analog, digital, and even RF circuitry on a single IC chip means higher density and pin counts. Higher pin counts require more test channels to main- tain acceptable throughput. Test system den- sity must also increase to stay within limited production space. Currently, production ATE systems can be categorized as bulky, high cost main- frame-based systems, slow instrument-based systems using PC control, or fast instrument- based systems that are extremely complex to develop. None of these are optimized for production processes. Manufacturers need to improve the performance of existing test stands, plus new test techniques, instru- Built-in Sequencer ments, and systems that minimize the cost of testing and ongoing ownership costs. These solutions should allow the systems to Accelerates Testing take on more of the test burden earlier in a